BIST Tourism and BIST Electricity Index Relationship

Memory BIST

Power Conscious BIST Approaches

The System-On-Chip (SOC) revolution has brought some new challenges to both design and test engineers. The most important challenges of today’s VLSI systems testing are linked to test cost, defect coverage and power dissipation. Implementing a self-testable system may reduce test costs as expensive external high performance test equipment is not required and it may increase defect coverage as t...

Accumulator based deterministic BIST

Most built-in self test (BIST) solutions require specialized test pattern generation hardware which may introduce significant area overhead and performance degradation. Recently, some authors proposed test pattern generation on chip by means of functional units also used in system mode like adders or multipliers. These schemes generate pseudo-random or pseudo-exhaustive patterns for serial or p...

Stop & Go BIST

A BIST method enabling two-pattern testing at-speed without violating thermal constraints by introducing cool down periods is proposed. The application of the method is demonstrated based on a scalable BIST architecture. Applicability on IP cores is given since only a two-pattern test set is required as input.

Circular BIST with state skipping

Circular built-in self-test (BIST) is a “test per clock” scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion. However, it has seen limited use because it does not reliably provide high fault coverage. This paper presents a systematic approach for achieving high fault coverage with circular BIST. Th...